Terai Masayuki | System Devices Research Laboratories Nec Corp.
スポンサーリンク
概要
関連著者
-
Terai Masayuki
System Devices Research Laboratories Nec Corp.
-
SAITOH Motofumi
System Devices Research Laboratories, NEC Corporation
-
Morioka Ayuka
System Devices Research Laboratories Nec Corporation
-
Fujieda Shinji
System Devices Research Laboratories Nec Corp.
-
寺井 真之
早稲田大学
-
FUJIEDA Shinji
System Devices Research Laboratories, NEC Corporation
-
MORIOKA Ayuka
System Devices Research Laboratories, NEC Corporation
-
IWAMOTO Toshiyuki
System Devices Research Laboratories, NEC Corporation
-
KOTSUJI Setsu
System Devices Research Laboratories, NEC Corporation
-
OGURA Takashi
System Devices Research Laboratories, NEC Corporation
-
WATANABE Hirohito
System Devices Research Laboratories, NEC Corporation
-
Yabe Yuko
System Devices Research Laboratories Nec Corp.
-
Kotsuji Setsu
System Devices Research Laboratories Nec Corporation
-
Ogura Takashi
System Devices And Fundamental Research Nec Corporation
-
Watanabe Hirohito
System Devices Research Laboratories Nec Corp.
-
寺井 真之
日本電気株式会社デバイスプラットフォーム研究所
-
YABE Yuko
System Devices Research Laboratories, NEC Corporation
-
SAITO Yukishige
System Devices Research Laboratories, NEC Corporation
-
WATANABE Heiji
System Devices Research Laboratories, NEC Corporation
-
Terai Masayuki
Department Of Applied Physics Waseda University
-
Watanabe Heiji
System Devices Research Laboratories Nec Corporation
-
SAITOH Motofumi
NEC Corporation, Device Platforms Research Laboratories
-
Saitoh Motofumi
Nec Corporation Device Platforms Research Laboratories
-
Saito Yukishige
System Devices Research Laboratories Nec Corp.
-
Ogura Takashi
Silicon Systems Research Laboratories Nec Corporation
-
Ogura Takeshi
Ntt Cyber Space Laboratories
-
IKARASHI Nobuyuki
System Devices Research Laboratories, NEC Corporation
-
WATANABE Koji
System Devices Research Laboratories, NEC Corporation
-
TATSUMI Toru
System Devices Research Laboratories, NEC Corporation
-
Ogura T
Ntt Network Innovation Laboratories
-
Iwamoto T
Keio Univ. Fujisawa‐shi Jpn
-
Tatsumi Toru
System Devices And Fundamental Research Nec Corporation
-
Ikarashi Nobuyuki
System Devices Research Laboratories Nec Corporation
-
Watanabe Koji
System Devices Research Laboratories Nec Corp.
-
Fujieda Shinji
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
MIYAMURA Makoto
System Devices Research Laboratories, NEC Corp.
-
IKARASHI Taeko
System Devices Research Laboratories, NEC Corp.
-
MASUZAKI Koji
System Devices Research Laboratories, NEC Corp.
-
Tatsumi Toru
System Devices Research Laboratories Nec Corporation
-
Masuzaki Koji
System Devices Research Laboratories Nec Corp.
-
Ikarashi Taeko
System Devices Research Laboratories Nec Corporation
-
IKARASHI Nobuyuki
NEC Corporation, Device Platforms Research Laboratories
-
MIYAMURA Makoto
NEC Corporation, Device Platforms Research Laboratories
-
Ikarashi N
Nec Corporation Device Platforms Research Laboratories
-
Miyamura Makoto
Nec Corporation Device Platforms Research Laboratories
-
Terai Masayuki
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Terai Masayuki
System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Morioka Ayuka
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Saito Yukishige
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Ikarashi Nobuyuki
System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Yabe Yuko
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Kotsuji Setsu
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Watanabe Hirohito
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Watanabe Hirohito
System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Fujieda Shinji
System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Saitoh Motofumi
System Devices Research Laboratories, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Saitoh Motofumi
System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
-
Iwamoto Toshiyuki
System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
著作論文
- Breakdown Mechanisms and Lifetime Prediction for 90-nm-Node Low-Power HfSiON/SiO_2 CMOSFETs
- Influence of Charge Traps within HfSiON Bulk on Positive and Negative Bias Temperature Instability of HfSiON Gate Stacks
- 1.2nm HfSiON/SiON Stacked Gate Insulators for 65-nm-Node MISFETs
- Breakdown Mechanisms and Lifetime Prediction for 90nm-node Low-power HfSiON/SiO_2 CMOSFETs
- Influences of Traps within HfSiON Bulk on Positive- and Negative-Bias Temperature Instability of HfSiON Gate Stacks
- 1.2nm HfSiON/SiON stacked gate insulators for 65nm-node MISFETs
- 1.2 nm HfSiON/SiON Stacked Gate Insulators for 65-nm-Node MISFETs
- Breakdown Mechanisms and Lifetime Prediction for 90-nm-Node Low-Power HfSiON/SiO2 CMOSFETs
- Influence of Charge Traps within HfSiON Bulk on Positive and Negative Bias Temperature Instability of HfSiON Gate Stacks