WATANABE Koji | System Devices Research Laboratories, NEC Corporation
スポンサーリンク
概要
関連著者
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寺井 真之
早稲田大学
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Terai Masayuki
System Devices Research Laboratories Nec Corp.
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FUJIEDA Shinji
System Devices Research Laboratories, NEC Corporation
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MORIOKA Ayuka
System Devices Research Laboratories, NEC Corporation
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IWAMOTO Toshiyuki
System Devices Research Laboratories, NEC Corporation
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SAITOH Motofumi
System Devices Research Laboratories, NEC Corporation
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OGURA Takashi
System Devices Research Laboratories, NEC Corporation
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WATANABE Hirohito
System Devices Research Laboratories, NEC Corporation
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IKARASHI Nobuyuki
System Devices Research Laboratories, NEC Corporation
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WATANABE Heiji
System Devices Research Laboratories, NEC Corporation
著作論文
- 1.2nm HfSiON/SiON Stacked Gate Insulators for 65-nm-Node MISFETs
- 1.2nm HfSiON/SiON stacked gate insulators for 65nm-node MISFETs