KOTSUJI Setsu | System Devices Research Laboratories, NEC Corporation

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概要

• KOTSUJI Setsuの詳細を見る
• 同名の論文著者
• System Devices Research Laboratories, NEC Corporationの論文著者

関連著者

• 寺井 真之

  早稲田大学

• Terai Masayuki

  System Devices Research Laboratories Nec Corp.

• FUJIEDA Shinji

  System Devices Research Laboratories, NEC Corporation

• MORIOKA Ayuka

  System Devices Research Laboratories, NEC Corporation

• KOTSUJI Setsu

  System Devices Research Laboratories, NEC Corporation

• SAITOH Motofumi

  System Devices Research Laboratories, NEC Corporation

• Morioka Ayuka

  System Devices Research Laboratories Nec Corporation

• Fujieda Shinji

  System Devices Research Laboratories Nec Corp.

• 寺井 真之

  日本電気株式会社デバイスプラットフォーム研究所

• YABE Yuko

  System Devices Research Laboratories, NEC Corporation

• IWAMOTO Toshiyuki

  System Devices Research Laboratories, NEC Corporation

• OGURA Takashi

  System Devices Research Laboratories, NEC Corporation

• SAITO Yukishige

  System Devices Research Laboratories, NEC Corporation

• WATANABE Hirohito

  System Devices Research Laboratories, NEC Corporation

• Yabe Yuko

  System Devices Research Laboratories Nec Corp.

• Kotsuji Setsu

  System Devices Research Laboratories Nec Corporation

• Terai Masayuki

  Department Of Applied Physics Waseda University

• SAITOH Motofumi

  NEC Corporation, Device Platforms Research Laboratories

• Saitoh Motofumi

  Nec Corporation Device Platforms Research Laboratories

• Ogura Takashi

  Silicon Systems Research Laboratories Nec Corporation

• Ogura Takeshi

  Ntt Cyber Space Laboratories

• WATANABE Heiji

  System Devices Research Laboratories, NEC Corporation

• Ogura T

  Ntt Network Innovation Laboratories

• Watanabe Heiji

  System Devices Research Laboratories Nec Corporation

• Iwamoto T

  Keio Univ. Fujisawa‐shi Jpn

• Ogura Takashi

  System Devices And Fundamental Research Nec Corporation

• Saito Yukishige

  System Devices Research Laboratories Nec Corp.

• Watanabe Hirohito

  System Devices Research Laboratories Nec Corp.

もっと見る 閉じる

著作論文

• Breakdown Mechanisms and Lifetime Prediction for 90-nm-Node Low-Power HfSiON/SiO_2 CMOSFETs
• Influence of Charge Traps within HfSiON Bulk on Positive and Negative Bias Temperature Instability of HfSiON Gate Stacks
• Breakdown Mechanisms and Lifetime Prediction for 90nm-node Low-power HfSiON/SiO_2 CMOSFETs
• Influences of Traps within HfSiON Bulk on Positive- and Negative-Bias Temperature Instability of HfSiON Gate Stacks

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