Effect of Defects Buried in Pentacene/Alkanethiol Self-Assembled Monolayer/Au Film on Its Electronic Properties Visualized by Scanning Tunneling Microscopy/Spectroscopy

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概要

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• We have used scanning tunneling microscopy/spectroscopy to visualize the spatial correlation between buried structural defects and observed electronic properties in organic device structures. As a typical structure of an organic field-effect transistor, we have prepared pentacene/alkanethiol self-assembled monolayer (SAM)/Au samples with or without defects associated with a gap state at the molecule/Au interface. The effect of the defects, which were hidden behind the pentacene overlayers, on the electronic properties of the SAM was clearly observed. The method used in this study has potential for evaluating the nanoscale correlation between electrical properties and hidden defects inside organic devices.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2010-08-25

著者

• Takeuchi Osamu

  Institute Of Applied Physics And 21st Coe University Of Tsukuba

• Shigekawa Hidemi

  Institute Of Applied Physics And 21st Coe University Of Tsukuba

• Taninaka Atsushi

  Institute Of Applied Physics Crest-jst University Of Tsukuba

• Yoshida Shoji

  Institute Of Applied Physics Crest University Of Tsukuba

• Terada Yasuhiko

  Institute Of Applied Physics University Of Tsukuba

• Yoshida Shoji

  Institute of Applied Physics, CREST-JST, University of Tsukuba, Tsukuba, Ibaraki 307-8573, Japan

• Takeuchi Noriaki

  Institute of Applied Physics, CREST-JST, University of Tsukuba, Tsukuba, Ibaraki 307-8573, Japan

• Terada Yasuhiko

  Institute of Applied Physics, CREST-JST, University of Tsukuba, Tsukuba, Ibaraki 307-8573, Japan

• Taninaka Atsushi

  Institute of Applied Physics, CREST-JST, University of Tsukuba, Tsukuba, Ibaraki 307-8573, Japan

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