Si(111) Surface under Phase Transitions Studied by the Analysis of Inner Layer Structures Using Bias-Dependent Scanning Tunneling Microscopy

スポンサーリンク

概要

著者

重川秀実
筑波大学物理工学系
SHIGEKAWA Hidemi
Institute of Applied Physics, University of Tsukuba
重川秀実
Univ. Tsukuba Tsukuba
Shigekawa Hidemi
Institute Of Applied Physics University Of Tsukuba
Shigekawa Hidemi
Institute Of Applied Physics And Crest Japan Science And Technology Corporation (jst) University Of
LI Yan
Institute of Natural Medicine, Toyama Medical and Pharmaceutical University
Oigawa Haruhiro
Institute of Materials Science, University of Tsukuba
Li Y
Inst. Molecular Sci. Okazaki Jpn
MIYAKE Koji
Institute of Applied Physics, CREST, Japan Science and Technology Corporation (JST), University of T
Kaikoh Takashi
Institute of Applied Physics, Center for TARA, CREST, Japan Science and Technology Corporation (JST)
Miyake K
Institute Of Applied Physics Crest Japan Science And Technology Corporation (jst) University Of Tsuk
Li Yan
Institute Of Applied Physics Crest Japan Science And Technology Corporation (jst) University Of Tsuk
Shigekawa Hidemi
Institute Of Applied Physics And 21st Coe University Of Tsukuba
Kaikoh Takashi
Institute Of Applied Physics Center For Tara Crest Japan Science And Technology Corporation (jst) Un
Komiyama M
Research Center For Advanced Science And Technology The University Of Tokyo
Oigawa H
Institute Of Applied Physics 21th Century Coe Nano Project University Of Tsukuba
Oigawa Haruhiro
Institute Of Materials Science University Of Tsukuba
Miyake Koji
Institute Of Applied Physics And Crest Japan Science And Technology Corporation (jst) University Of
Oigawa Haruhiro
Institute of Applied Physics, 21th Century COE, NANO project, University of Tsukuba, Tsukuba 305-8573, Japan

関連論文

もっと見る

スポンサーリンク