Kelvin Probe Force Microscopy without Bias-Voltage Feedback
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概要
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A variation of Kelvin probe force microscopy that does not require bias-voltage feedback for contact potential difference (CPD) detection was proposed. Two independent lock-in amplifiers were used to measure the first- and second-order derivatives of the electrostatic force exerted on the cantilever, and CPD was deductively determined from these signals. The application of this technique to the unsaturated Au/Si(111)-$5\times 2$ system confirmed that the instability of the measurement system resulting from bias-voltage feedback can be completely eliminated and that CPD measurement at a finite bias voltage is possible.
- 2007-08-30
著者
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Takeuchi Osamu
Institute Of Applied Physics And 21st Coe University Of Tsukuba
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Shigekawa Hidemi
Institute Of Applied Physics And 21st Coe University Of Tsukuba
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Yoshida Shoji
Institute Of Applied Physics Crest University Of Tsukuba
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Yoshida Shoji
Institute of Applied Physics, CREST-JST, 21st Century COE, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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Ohrai Yoshihisa
Institute of Applied Physics, CREST-JST, 21st Century COE, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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Takeuchi Osamu
Institute of Applied Physics, CREST-JST, 21st Century COE, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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