Dynamics of Phasoms; Phase Defects Formed on Dimer Rows and Related Structural Changes of the Si(100) Surface at 80 K Studied by Scanning Tunneling Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-03-01
著者
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重川 秀実
筑波大学物理工学系
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SHIGEKAWA Hidemi
Institute of Applied Physics, University of Tsukuba
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重川 秀実
Univ. Tsukuba Tsukuba
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Shigekawa Hidemi
Institute Of Applied Physics University Of Tsukuba
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Shigekawa Hidemi
Institute Of Applied Physics And Crest Japan Science And Technology Corporation (jst) University Of
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MIYAKE Koji
Institute of Applied Physics, CREST, Japan Science and Technology Corporation (JST), University of T
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Ishida Masahiko
Institute Of Materials Science University Of Tsukuba
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Miyake K
Institute Of Applied Physics Crest Japan Science And Technology Corporation (jst) University Of Tsuk
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Hata Kenji
Institute of Applied Physics and CREST, Japan Science Technology Cooperation, University of Tsukuba
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Hata K
Institute Of Applied Physics Crest University Of Tsukuba
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Shigekawa Hidemi
Institute Of Applied Physics And 21st Coe University Of Tsukuba
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Komiyama M
Research Center For Advanced Science And Technology The University Of Tokyo
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Miyake Koji
Institute Of Applied Physics And Crest Japan Science And Technology Corporation (jst) University Of
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