Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
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概要
- 論文の詳細を見る
Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaN_[x]As_[1-x] (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement.
- American Institute of Physicsの論文
- 2004-10-11
著者
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森田 隆二
北海道大学大学院工学研究科応用物理学専攻
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重川 秀実
筑波大学物理工学系
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Takeuchi O
大阪大学免疫学フロンティア研究センター 自然免疫学
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重川 秀実
Univ. Tsukuba Tsukuba
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Shigekawa Hidemi
Institute Of Applied Physics University Of Tsukuba
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Shigekawa Hidemi
Institute Of Applied Physics And Crest Japan Science And Technology Corporation (jst) University Of
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Takeuchi Osamu
Institute Of Applied Physics University Of Tsukuba
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森田 隆二
北大 大学院工学研究科
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Takeuchi O
Institute Of Applied Physics University Of Tsukuba
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Morita Ryuji
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Oigawa H
Institute Of Applied Physics 21th Century Coe Nano Project University Of Tsukuba
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