Effect of Nitrogen Incorporation into InAs layer in InAs/InGaAs Self-Assembled Quantum Dots
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概要
- 論文の詳細を見る
We present the results of nitrogen incorporation into the InAs layer in InAs/InGaAs quantum dots (QDs). We show that this incorporation causes an asymmetric photoluminescence (PL) line shape and abnormally large redshift of the PL peak from the quantum dots as temperature increases. In addition, this incorporation causes a large series resistance and a rapid increase in reverse current at a bias corresponding to the QD region. This effect is due to the formation of a deep trap at 0.34–0.41 eV, which depletes the carriers in the QD region. This depletion gives rise to a geometric resistance-capacitance time-constant effect for the ac conductivity of the free electrons in the top GaAs layer. This trap markedly alters the emission properties of the QD structure. The ac conductivity of the QD structure is governed by the thermal activation of trapped electrons rather than the electron emission from the QD confined states. This incorporation significantly increases the electron emission time from the QD region and, thus, can be used intentionally to modify the emission properties of the QD structure.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-09-15
著者
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Chen Jenn-fang
Department Of Electrophysics National Chiao Tung University
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Chen Yu-chih
Department Of Electrophysics National Chiao Tung University
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CHI Jim-Y
Industrial Technology Research Institute (OES/ITRI)
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Hsiao Ru-shang
Department Of Electrophysics National Chiao Tung University
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Chi Jim-Y
Industrial Technology Research Institute (OES/ITRI), Hsinchu, Taiwan, R.O.C.
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Hsiao Ru-Shang
Department of Electrophysics, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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Wang Jyh-Shyang
Department of Physics, Chung Yuan Christian University, Chung-Li, Taiwan, R.O.C.
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Wang Jyh-Shyang
Department of Physics and Center of Nanotechnology, Chung-Yuan Christian University, 200 Chung Pei Road, Chungli 320, Taiwan
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Hsieh Ming-Ta
Department of Electrophysics, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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Chen Yi-Ping
Department of Electrophysics, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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Hsieh Ming-Ta
Department of Electrophysics, National Chiao Tung University, Hsinchu, Taiwan 30050, Republic of China
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Chen Jenn-Fang
Department of Electrophysics, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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Chen Yu-Chih
Department of Electrophysics, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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