Properties of Defect Traps in Triple-Stack InAs/GaAs Quantum Dots and Effect of Annealing
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2004-09-15
著者
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Chen Jenn-fang
Department Of Electrophysics National Chiao Tung University
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Chi Jim
Industrial Technology Research Institute (oes/itri)
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Wang Jenn-shing
Department Of Materials Science And Engineering National Cheng-kung University
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HSIAO Ru-Shang
Department of Electrophysics, National Chiao Tung University
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SHIH Shen-Hung
Department of Electrophysics, National Chiao Tung University
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WANG Pai-Yong
Industrial Technology Research Institute
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WANG Jyh-Shyang
Industrial Technology Research Institute
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