Indium-Tin-Oxide Thin Films Prepared by Dip Coating; Dependence of Resistivity on Film Thickness and Annealing Atmosphere : Surfaces, Interfaces, and Films

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2001-11-15

著者

• OGAWA Makoto

  Department of Nuclear Engineering, School of Engineering, Tokai University

• SAWADA Yutaka

  Department of Applied Chemistry, Tokyo Institute of Polytechnics

• Seki S

  Department Of Industrial Chemistry Graduate School Of Engineering Tokyo Institute Of Polytechnics

• Sawada Y

  Department Of Industrial Chemistry Graduate School Of Engineering Tokyo Institute Of Polytechnics

• Ogawa M

  Department Of Industrial Chemistry Graduate School Of Engineering Tokyo Institute Of Polytechnic

• SEKI Shigeyuki

  Department of Industrial Chemistry, Graduate School of Engineering, Tokyo Institute of Polytechnics

• Chen Kuei-hsien

  Institute Of Atomic And Molecular Sciences Academia Sinica

• Ogawa Makoto

  Department Of Earth Environment And Resources Sciences Graduate School Of Creative Science And Engin

• Sawada Yutaka

  Department Of Applied Chemistry Faculty Of Engineering Tokyo Institute Of Polytechnics

• Wang Jih-hsiang

  Optoelectronics And Systems Laboratories Industrial Technology Research Institute

• Ogawa Makoto

  Department Mechanical Engineering Ii Shibaura Institute Of Technology

• Seki Shigeyuki

  Department of Electronic Engineering, Sendai National College of Technology, 4-16-1 Ayashichuo, Aoba-ku, Sendai 989-3128, Japan

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