Photoreflectance of CuAl_xIn_<1-x>Se_2 Alloys(Semiconductors)
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概要
- 論文の詳細を見る
Photoreflectance (PR) measurements have been carried out at 77K on single crystals of CuAl_xIn_<1-x>Se_2 grown by the chemical vapor transport method. Energies of excitons associated with uppermost valence bands have been determined as a function of composition based on the analysis of PR spectra. Spin-orbit and crystal field parameters have been obtained.
- 社団法人応用物理学会の論文
- 2002-01-15
著者
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Miyake Hideto
Faculty Of Engineering Mie University
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Shirakata Sho
Faculty Of Engineering Ehime University
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