Time-Resolved X-Ray Absorption Spectroscopy for Laser-Ablated Silicon Particles in Xenon Gas
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概要
- 論文の詳細を見る
We developed a laboratory-scale in situ apparatus for soft X-ray absorption spectroscopy with a time resolution of 10 ns and a space resolution of 100 μm. Utilizing this spectrometer, we have investigated the dynamics of silicon atoms formed by laser ablation in xenon gas. It was found that 4d-electrons in the xenon atoms are excited through collision with electrons in the laser-generated silicon plasma.
- 社団法人応用物理学会の論文
- 1996-06-01
著者
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MURAKAMI Kouichi
Institute of Materials Science, University of Tsukuba, Tsukuba Academic City
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MAKIMURA Tetsuya
Institute of Applied Physics, University of Tsukuba
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Murakami Kouichi
Institute Of Applied Physics University Of Tsukuba
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Makimura Tetsuya
Institute Of Applied Physics University Of Tsukuba
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Makimura Tetsuya
Institute Of Materials Science University Of Tsukuba
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SAKURAMOTO Tamaki
Institute of Materials Science, University of Tsukuba
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Sakuramoto Tamaki
Institute Of Materials Science University Of Tsukuba
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