H_2-related Defects in Si Quenched in H_2 Gas Studied by Optical Absorption Measurements

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1999-05-01

著者

• SUEZAWA Masashi

  Institute for Materials Research,Tohoku University

• Suezawa Masashi

  Institute For Materials Research Tohoku University

関連論文

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• The Nature of Nitrogen-Oxygen Complexes in Silicon
• H_2-related Defects in Si Quenched in H_2 Gas Studied by Optical Absorption Measurements
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