Characterization of Thin-Film Interference Effect due to Surface Roughness
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-07-15
著者
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KAWAI AKIRA
Department of Orthopaedic Surgery, Okayama University
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Nagata Hitoshi
Ulsi Laboratory Mitsubishi Electric Corporation
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Yamaguchi Atsumi
Ulsi Development Center Mitsubishi Electric Corporation
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Yamaguchi A
Iwate Univ. Morioka Jpn
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Kawai Akira
Department Of Orthopaedic Surgery National Cancer Center Hospital
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Kawai Akira
Department Of Electrical Engineering Nagaoka University Of Technology
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