Energy Analysis of Kikuchi Patterns
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1969-07-05
著者
-
Ichinokawa Takeo
Department Of Applied Physics School Of Science And Engineering Waseda University
-
Kamigaki Yoshiaki
Department Of Applied Physics Waseda University
-
Ohtsuki Y.H.
Department of Physics, Waseda University
-
Ohtsuki Y.h.
Department Of Physics Waseda University
-
Ohtsuki Y.h.
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
-
Kamigaki Yoshiaki
Department of Advanced Materials Science, Faculty of Engineering, Kagawa University, Takamatsu 761-0396, Japan
関連論文
- Electro- and Thermomigration of Metallic Islands on Si(100) Surface
- A New Normalization Method for the Electron Energy-Loss Spectrum
- Experimental Study of Inelastic Process at the Crystal Surface in Angle Resolved Low-Energy Electron Energy Loss Spectroscopy
- On Anomalous Phase Change of Ammonium Nitrate NH_4NO_3.
- Effect of Stress on Domain Structure of Tungsten Trioxide WO_3.
- Electron Spin Resonance and Photoluminescence Study of Charge Trap Centers in Silicon Nitride Films and Fabrication of Proposed Oxide–Nitride–Oxide Sidewall 2-bit/Cell Nonvolatile Memories
- Kikuchi Patterns and Inelastic Scattering
- Energy Analysis of Kikuchi Patterns
- Charging Effect of Specimen in Scanning Electron Microscopy
- Electron Energy Analysis by a Cylindrical Magnetic Lens
- Absorbed Specimen Current Anomaly of Cu-Zn Diffusion Couple in Electron Scanning Microscope
- Observation of Crystal Defects by Pseudo-Kissed Lines on X-Ray Projection Micrograph
- Pseudo-Kikuchi Patterns in Reduced Scanning Region for Monocrystals of Silicon
- Effect of Electron Source to Energy Resolution in Electron Velocity Analysis : Interpretation of Boersch Effect
- Density Effect of X-Ray Emission from Porous Specimens in Quantitative Electron Probe Microanalysis
- Valiation of X-Ray Emission from GaAs Single Crystal with Incident Electron Beam Direction
- Contrast Reversals of Pseudo-Kikuchi Band and Lines Due to Detector Position in Scanning Electron Microscopy
- X-Ray Microdiffraction with a Scanning X-Ray Microanalyzer
- Measurements of Ratio of Abnomal to Normal Absorption Coefficients for Electrons in Crystal from Pseudo-Kikuchi Patterns
- Contrast Reversal of Kikuchi Bands in Transmission Electron Diffraction
- Effect of Lattice Vibration on the Absorption Coefficient in Electron Diffraction
- Relativistic Dynamical Theory of Electron Difraction
- Theory of Low Energy Electron Diffraction. : II. OPW Method
- Measurements of Evaporated Film Thickness and Concentration by Electron Probe X-Ray Microanalyzer
- The Polarization Mixing of X-Rays
- Dynamical Theory of Diffraction. : II. X-Ray Diffraction
- Dynamical Theory of Diffraction : I. Electron Diffraction
- Temperature Dependence of X-Ray Absorption by Crystals II. Direct Phonon Absorption
- Electron Spin Resonance Observation of Bias-Temperature Stress-Induced Interface Defects at NO/N2O-Annealed Chemical-Vapor-Deposition SiO2/(100) p-Si Substrates
- The Theory of the Low Energy Electron Diffraction : I. Strong Absorption
- Effects of Lattice vibrations on Dynamical Diffraction of Electron and X-Rays
- Paramagnetic Defect Spin Centers in Porous SiOCH Film Investigated Using Electron Spin Resonance
- Simple Electron Monochromator of Three-Diaphragm Einzel Lens
- Analysis of Carrier Traps in Silicon Nitride Film with Discharge Current Transient Spectroscopy, Photoluminescence, and Electron Spin Resonance
- The Theory of Normal and Abnormal Absorptions in Electron Diffraction