Valiation of X-Ray Emission from GaAs Single Crystal with Incident Electron Beam Direction

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Valiation of X-Ray Emission from GaAs Single Crystal with Incident Electron Beam Direction
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X-Ray Microdiffraction with a Scanning X-Ray Microanalyzer
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Contrast Reversal of Kikuchi Bands in Transmission Electron Diffraction
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Application of the DisPersion Relation to Determine the Anomalous Scattcrino Factors : EXAFS AND RELATED PHENOMENA
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