Automatic Seal Imprint Verification System with Imprint Quality Assessment Function and Its Performance Evaluation
スポンサーリンク
概要
- 論文の詳細を見る
An annoying problem encountered in automatic seal imprint verification is that the seal imprints may have a lot of variations, even if they are all produced from a single seal. This paper proposes a new automatic seal imprint verification system which adds an imprint quality assessment function to our previous system in order to solve this problem, and also examines the verification performance of this system experimentally. This system consists of an imprint quality assessment process and a verification process. In the imprint quality assessment process, an examined imprint is first divided into partial regions. Each partial region is classified into one of three quality classes (good quality region, poor quality region, and background) on the basis of characteristics of its gray level histogram. In the verification process, only good quality partial regions of an examined imprint are verified with registered one. Finally, the examined imprint is classified as one of two types: a genuine and a forgery. However, as a result of quality assessment, if the partial regions classified as poor quality are too many, the examined imprint is classified as "ambiguous" without verification processing. A major advantage of this verification system is that this system can verify seal imprints of various qualities efficiently and accurately. Computer experiments with real seal imprints were performed by using this system, previous system (without image quality assessment function) and document examiners of a bank. The results of these experiments show that this system is superior in the verification performance to our previous system, and has a similar verification performance to that of document examiners (i.e., the experimental results show the effectiveness of adding the image quality assessment function to a seal imprint verification system).
- 社団法人電子情報通信学会の論文
- 1994-08-25
著者
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Ueda K
Mitsubishi Electric Corp. Itami‐shi Jpn
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Ueda Kimio
System Lsi Development Center Mitsubishi Electric Corp.
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Ueda K
System Lsi Laboratory Mitsubishi Electric Corporation
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Ueda K
Ntt Atsugi‐shi Jpn
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Ueda Katsuhiko
Department Of Electronics And Information Technology Osaka Electro-communication University Junior C
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Ueda Katsuhiko
Depariment Of Information & Computer Engineering Nara National College Of Technology
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Ueda Katsuhiko
Department Of Information Engineering Nara National College Of Technology
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