Study of Electronic Properties by Persistent Photoconductivity Measurement in Ga_xIn_<1-x>N_yAs_<1-y> Grown by MOCVD

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-04-30

著者

• Su Y

  National Cheng Kung Univ. Tainan Twn

• CHANG S.

  Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University

• CHEN W.

  Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University

• SU Y.

  Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University

• CHEN W.

  Department of Photonics & Institute of Electro-Optical Engineering, National Chiao Tung University

• Chuang R.

  Institute Of Microelectronics Department Of Electrical Engineering And Advanced Optoelectronic Techn

• HSU S.

  Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University

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