Evaluations of Scaling Properties for Ge on Insulator MOSFETs in Nano-Scale

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-04-30

著者

• Liu Xiao

  Institute Of Bioengineering College Of Life Sciences Zhejiang Sci-tech University

• Kang Jin

  Institute Of Microelectronics Peking University

• Du Gang

  Institute Of Microelectronics Peking University

• Xia Zhi

  Institute Of Microelectronics Peking University

• WANG Ya

  Institute of Microelectronics, Peking University

• HOU Dan

  Institute of Microelectronics, Peking University

• HAN Ru

  Institute of Microelectronics, Peking University

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