Schottky Barrier Height Determination by Capacitance-Voltage Measurement on n-GaN with Exponential Doping Profile
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概要
- 論文の詳細を見る
- 2004-07-15
著者
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Ohno Yasuo
Univ. Tokushima Tokushima‐shi Jpn
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KIKUTA Daigo
Department of Electrical and Electronic Engineering, The University of Tokushima
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AO Jin-Ping
Department of Electrical and Electronic Engineering, The University of Tokushima
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OHNO Yasuo
Department of Electrical and Electronic Engineering, The University of Tokushima
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KUBOTA Naotaka
Department of Electrical and Electronic Engineering, The University of Tokushima
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Ao J‐p
Univ. Tokushima Tokushima‐shi Jpn
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Kikuta Daigo
Department Of Electrical And Electronic Engineering The University Of Tokushima
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