Throughput Measurement of a Multilayer-Coated Schwarzschild Objective Using Synchrotron Radiation
スポンサーリンク
概要
- 論文の詳細を見る
- 2000-12-01
著者
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渡部 行男
九大院理
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Watanabe Yoshihide
Department Of Electronics Faculty Of Engineering Tottori University
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Watanabe Yoshihide
Toyota Central Research And Development Laboratories Inc.
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Horikawa Yoshiaki
Olympus Optical Co. Ltd.
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Nath Krishna
Ntt Basic Research Laboratories
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渡部 行男
九州工業大学工学部電気工学科
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OSHIMA Masaharu
Department of Engineering, University of Tokyo
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Watanabe Y
Kyushu Univ. Fukuoka Jpn
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Oshima M
Department Of Applied Chemistry The University Of Tokyo
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Oshima M
Univ. Tokyo Tokyo
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Oshima M
Department Of Engineering The University Of Tokyo
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IKETAKI Yoshinori
NTT Advanced Technology Corporation
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MAEDA Fumihiko
NTT Basic Research Laboratories
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WATANABE Yoshio
NTT Basic Research Laboratories
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KIYOKURA Takanori
NTT Basic Research Laboratories
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Iketaki Yoshinori
Presto "light And Material" Japan Science And Technology Agency
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Iketaki Yoshinori
Olympus Optical Co. Ltd.
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Iketaki Yoshinori
Advanced Technology Research Center Olympus Optical Co. Ltd.
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Nagai K
Olympus Optical Co. Ltd.
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Maeda F
Ntt Basic Research Laboratories
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NAGAI Koumei
Olympus Optical Co., Ltd.
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SHIGEMASA Eiji
High Energy Accelerator Research Organization
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YAGISHITA Akira
High Energy Accelerator Research Organization
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Horikawa Y
Olympus Optical Co. Ltd.
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Oshima Masaharu
Department Of Applied Chemistry Graduate School Of Engineering The University Of Tokyo
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Iketaki Y
Presto "light And Material" Japan Science And Technology Agency
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OSHIMA Masaharu
Department of Applied Chemistry and JST-CREST, The University of Tokyo
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