Epitaxial Stress Effect on Crystallographic Properties of Bi_4Ti_3O_<12> Heterostructures and Their Leakage Current Behaviors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-11-15
著者
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渡部 行男
九大院理
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Matsumoto Y
Materials And Structures Laboratory Tokyo Institute Of Technology
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Watanabe Yukio
Mitsubishi Chemical Yokohama Research Center
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WATANABE Yukio
Kyushu Institute of Technology
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MATSUMOTO Yasuaki
Mitsubishi Chemical Yokohama Research Center
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TANAMURA Mitsuru
Mitsubishi Chemical Yokohama Research Center
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Matsumoto Yoshinari
Department Of Electrical And Electronic Engineering Toyo University
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Matsumoto Y
Nara Inst. Sci. And Technol. Ikoma‐shi Jpn
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Matsumoto Yuji
Materials And Structures Laboratory Tokyo Institute Of Technology
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- Single-Shot Measurement of Spectral Reflectance of a Soft X-Ray Multilayer Mirror Using a Laser-Plasma X-Ray Source
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