スポンサーリンク
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China | 論文
- Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors
- Performance Investigation on p-Type Si-, Ge-, and Ge--Si Core--Shell Nanowire Schottky Barrier Transistors
- New Observations and Impacts of Diameter-Dependent Annealing Effects in Silicon Nanowire Transistors
- Evaluations of Scaling Properties for Ge on Insulator MOSFETs in Nano-Scale
- Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal–Oxide–Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition
- Forward-Body-Bias-Enhanced Negative Bias Temperature Instability Recovery of p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors
- Triple-Gate Fin Field Effect Transistors with Fin-Thickness Optimization to Reduce the Impact of Fin Line Edge Roughness
- Impact of Gate Overlap on Performance of Schottky Barrier Metal–Oxide–Semiconductor Field-Effect Transistors Including Gate Induced Barrier Lowering Effect
- Monte Carlo Simulation of Band-to-Band Tunneling in Silicon Devices
- Gd Doping Improved Resistive Switching Characteristics of TiO2-Based Resistive Memory Devices
- Effects of Shell Strain on Valence Band Structure and Transport Properties of Ge/Si1-xGex Core–Shell Nanowire
- The Effect of Current Compliance on the Resistive Switching Behaviors in TiN/ZrO2/Pt Memory Device
- Effect of O
- A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negative Bias Temperature Instability Degradation
- Fully Transparent Al-Doped ZnO Thin-Film Transistors on Flexible Plastic Substrates
- In vitro short-term bonding performance of zirconia treated with hot acid etching and primer conditioning etching and primer conditioning