Effect of O
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概要
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High-performance aluminum-doped zinc oxide thin-film transistors (AZO TFTs) have been successfully fabricated on glass substrates. By controlling the oxygen flow ratio (OFR) during the deposition of an AZO active layer, we have demonstrated that the incorporation of oxygen in the deposition atmosphere plays an important role in improving the electronic performance of TFTs. For gate voltage V_{\text{G}} = -2 to 5 V, the TFTs with an AZO active layer sputter deposited in an atmosphere of Ar and O<inf>2</inf>mixture at room temperature (RT) as the channel layer exhibit much better properties than TFTs whose AZO layer was deposited in pure Ar atmosphere, such as a high saturation mobility (\mu_{\text{sat}}) of 113 cm<sup>2</sup>V<sup>-1</sup>s<sup>-1</sup>, a positive threshold voltage V_{\text{th}} of 1.5 V, an improved steep subthreshold swing from 400 to 125 mV/decade, a decreased off-state current (I_{\text{off}}) from 10^{-8} to 5\times 10^{-13} A, an increased on/off ratio from 10^{5} to 10^{9}, and a higher transmittance of 82.5%.
- 2013-04-25
著者
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Zhang Xing
Institute Of Advanced Material Study Kyushu University
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Wang Yi
Institute For Horticultural Plants China Agricultural University
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Wang Wei
Institute Of Atmospheric Physics Chinese Academy Of Sciences
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Han Dedong
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China
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Zhang Xing
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Cai Jian
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Geng Youfeng
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Wang Liangliang
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Tian Yu
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Qian Lixun
School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, People's Republic of China
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Zhang Shengdong
Shenzhen Graduate School, Peking University, Shenzhen 518055, People's Republic of China
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Tian Yu
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China
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Cai Jian
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China
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Cai Jian
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Wang Liangliang
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China
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Wang Liangliang
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Zhang Shengdong
Shenzhen Graduate School, Peking University, Shenzhen 518055, P. R. China
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Geng Youfeng
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China
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Geng Youfeng
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Wang Yi
Institute of Microelectronics, Peking University, Beijing 100871, People's Republic of China
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Qian Lixun
School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, People's Republic of China
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