Jeong Yoon-Ha | Department of Creative IT Excellence Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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概要
- Jeong Yoon-Haの詳細を見る
- 同名の論文著者
- Department of Creative IT Excellence Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Koreaの論文著者
関連著者
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Jeong Yoon-Ha
Department of Creative IT Excellence Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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Jeong Yoon-ha
Department Of Electrical And Electronic Engineering Pohang University Of Science And Technology
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JEONG Yoon-Ha
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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Jeong Y‐h
Pohang Univ. Sci. And Technol. Kyungpook Kor
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Jeong Moon-Young
Department of Electrical and Electronic Engineering Pohang University of Science and Technology
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Lee B‐h
Dongguk Univ. Seoul Kor
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Jeong M‐y
Electrical And Computer Engineering Division Pohang University Of Science And Technology
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Jeong Yoon-ha
Electrical And Computer Engineering Division Pohang University Of Science And Technology
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Lee Bong-Hoon
Department of Electrical and Electronic Engineering Pohang University of Science and Technology
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BAEK Chang-Ki
Korea Institute for Advanced Study
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Jeong Yoon-ha
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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JO Seong-Kue
Department of Electronic and Electrical Engineering and Microwave Application Research Center, Pohan
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Jo Seong-kue
Department Of Electronic And Electrical Engineering And Microwave Application Research Center Pohang
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Kim Dae
Korea Atomic Energy Research Institute
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Kwon Wookhyun
Memory Division Semiconductor Business Samsung Electronics Company Ltd.
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KIM Bomsoo
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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Kim D
Korea Institute For Advanced Study
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Cheong Hai-du
Department Of Electronic And Electrical Engineering Division Of Electrical And Computer Engineering
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KIM Dae
Korea institute for Advanced Study
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KIM Dae
Department of Anatomy and Center for Advanced Medical Education by BK21 Project, Inha University Col
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Hwang S‐w
National Chiao Tung Univ. Hsinchu Twn
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Jeon Y‐j
Memory Design Department 1 Lg Semicon
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Jeon M‐y
Samsung Advanced Inst. Technol. Suwon Kor
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Jeong D‐h
Pohang Univ. Sci. And Technol. (postech) Pohang Kor
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Choi Do-young
Department Of Acupuncture & Moxibustion College Of Oriental Medicine Kyunghee University
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JEON Man-Young
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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KIM Byung-Gyu
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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JEON Young-Jin
Memory Design Department, 1, LG Semicon
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SUGANO Takuo
Laboratory for Quantum Materials, Frontier Research Program, Institute of Physical and Chemical Rese
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Hayes J
Bellcore 331 Newman Springs Rd. Red Bank
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Jeong Yoon-ha
Department Of Electronic And Electrical Engineering Division Of Electrical And Computer Engineering
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Jeong Yoon-ha
Department Of Electronic And Electrical Engineering Pohang Institute Of Science And Technology
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Jo Seong-kue
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Jeong Moon-young
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Kim Dae
Department Of Anatomy And Center For Advanced Medical Education By Bk21 Project Inha University Coll
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Kim Dae
Magnachip Semiconductor Inc.
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Pyo Hyun-myung
Wireless Communications Research Lab. Korea Telecommunication
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Caneau Catherine
Bellcore 331 Newman Springs Rd. Red Bank
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Ahn Kwang-ho
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Yun C‐e
Electronics And Telecommunications Res. Inst. Taejeon Kor
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Kang Bongkoo
Department Of Electrical Engineering Pohang University Of Science And Technology
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Kang Bongkoo
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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JEON Young-Jin
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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YUN Chan-Eui
Wireless Communications Research Lab., Korea Telecommunication
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Jeon Young-jin
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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JEONG Dong-Ho
Department of Electronic and Electrical Engineering, Pohang Institute of Science and Technology
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HONG Won-Pyo
Bellcore, 331 Newman Springs Rd. Red Bank
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BHAT Raje
Bellcore, 331 Newman Springs Rd. Red Bank
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HAYES John
Bellcore, 331 Newman Springs Rd. Red Bank
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Bhat Raje
Bellcore 331 Newman Springs Rd. Red Bank
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Hong Won-pyo
Bellcore 331 Newman Springs Rd. Red Bank
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LEE Jawoong
Korea Institute for Advanced Study
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Kim Byung-gyu
Department Of Electrical Engineering And Computer Science Korea Advanced Institute Of Science And Te
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Kim Byung-gyu
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Kim Dae-byung
Dept. Of Materials Engineering Korea University Of Technology And Education
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HWANG Sung-Woo
School of Electrical Engineering, Korea University
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Choi Ki-Hwan
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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CHEONG Hai-Du
Department of Electronic and Electrical Engineering, Division of Electrical and Computer Engineering
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Choi Ki-hwan
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Sugano Takuo
Laboratory For Nano-electronics Materials Frontier Materials Research Program The Institute Of Physi
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Jeong Dong-ho
Department Of Electronic And Electrical Engineering Pohang Institute Of Science And Technology
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JEON Man-Young
Digital Comm.Lab., IP Sector, Samsung Advanced Institute of Technology
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Jeon Man-young
Digital Comm.lab. Ip Sector Samsung Advanced Institute Of Technology
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Kang Chang
Semiconductor R&d Samsung Electronics Co. Ltd.
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Baek Chang-Ki
Korea Institute for Advanced Study, 207-43 Cheongryangri, Seoul, Korea
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Jeong Yoon-Ha
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology, San 31, Hyojadong, Namgu, Pohang, 790-784, Korea
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Kim Bomsoo
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology, San 31, Hyojadong, Namgu, Pohang, 790-784, Korea
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Kim Dae
Korea Institute for Advanced Study, 207-43 Cheongryangri, Seoul, Korea
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Kwon Wookhyun
Memory Division, Semiconductor Business, Samsung Electronics Company, Ltd., Kyungki-Do, 449-900, Korea
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Cheong Hai-Du
Department of Electronic and Electrical Engineering, Division of Electrical and Computer Engineering, Pohang University of Science and Technology, San-31, Hyoja-dong, Nam-gu, Pohang, Kyungpook, 790-784, Korea
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Choi Do-Young
Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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Sohn Chang-Woo
Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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Sagong Hyun
Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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Jung Eui-Young
Division of IT Convergence Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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Lee Jeong-Soo
Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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Jeong Yoon-Ha
Department of Electronic and Electrical Engineering, Division of Electrical and Computer Engineering, Pohang University of Science and Technology, San-31, Hyoja-dong, Nam-gu, Pohang, Kyungpook, 790-784, Korea
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Kang Chang
Semiconductor Manufacturing Technology (SEMATECH), Austin, TX 78741, U.S.A.
著作論文
- A Technique for Extracting Small-Signal Equivalent-Circuit Elements of HEMTs (Special Issue on High-Frequency/speed Devices in the 21st Century)
- ED2000-59 / SDM2000-59 Calculation of Electrical Transport Properties for Novel Single Gated Single Electron Transistors
- ED2000-59 / SDM2000-59 Calculation of Electrical Transport Properties for Novel Single Gated Single Electron Transistors
- Effects of Sulfide Treatment on InP Metal-Insulator-Semiconductor Devices with Photochemical Vapor Deposit P_3N_5 Gate Insulators
- Enhanced Current-Voltage Characteristics of Al_Ga_As/In_Ga_As/GaAs P-HEMTs Using an Inverted Double Channel Structure
- AlInAs/InP Delta-Doped Channel Field Effect Transistor Grown by Organometallic Chemical Vapor Deposition
- Simple Experimental Determination of the Spread of Trapped Hot Holes Injected in Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Cells : Optimized Erase and Cell Shrinkage
- Performance of Single-Electron Transistor Logic Composed of Multi-gate Single-Electron Transistors
- Effects of Sulfide Passivation on the Performance of GaAs MISFETs with Photo-CVD Grown P_3N_5 Gate Insulators
- Optically Detected Resonance Studies of Neutral and Negatively Charged Donors in GaAs/AlGaAs Quantum Well Structures
- An Approach to Extract Extrinsic Parameters of HEMTs
- Improved Degradation and Recovery Characteristics of SiGe p-Channel Metal--Oxide--Semiconductor Field-Effect Transistors under Negative-Bias Temperature Stress
- Spatial and Temporal Characterization of Programming Charge in SONOS Memory Cell: Effects of Localized Electron Trapping
- Optically Detected Resonance Studies of Neutral and Negatively Charged Donors in GaAs/AlGaAs Quantum Well Structures