Jeong Y‐h | Pohang Univ. Sci. And Technol. Kyungpook Kor
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概要
関連著者
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Jeong Y‐h
Pohang Univ. Sci. And Technol. Kyungpook Kor
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JEONG Yoon-Ha
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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Jeong Yoon-ha
Department Of Electrical And Electronic Engineering Pohang University Of Science And Technology
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Jeong Yoon-Ha
Department of Creative IT Excellence Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
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Lee B‐h
Dongguk Univ. Seoul Kor
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Jeong Yoon-ha
Electrical And Computer Engineering Division Pohang University Of Science And Technology
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Jeong M‐y
Electrical And Computer Engineering Division Pohang University Of Science And Technology
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Lee Bong-Hoon
Department of Electrical and Electronic Engineering Pohang University of Science and Technology
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Jeong Moon-Young
Department of Electrical and Electronic Engineering Pohang University of Science and Technology
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KIM Dae
Korea institute for Advanced Study
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BAEK Chang-Ki
Korea Institute for Advanced Study
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Kwon Wookhyun
Memory Division Semiconductor Business Samsung Electronics Company Ltd.
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KIM Bomsoo
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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Kim D
Korea Institute For Advanced Study
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JEONG Se-Young
Department of Physics, Pusan National University
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Jeon Y‐j
Memory Design Department 1 Lg Semicon
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Jeon M‐y
Samsung Advanced Inst. Technol. Suwon Kor
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Jeong Se-young
Department Of Physics And Research Center For Dielectric And Advanced Matter Physics Pusan National
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JEON Man-Young
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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KIM Byung-Gyu
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
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JEON Young-Jin
Memory Design Department, 1, LG Semicon
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SUGANO Takuo
Laboratory for Quantum Materials, Frontier Research Program, Institute of Physical and Chemical Rese
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Jeong Yoon-ha
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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JEONG Moon-Young
Electrical and Computer Engineering Division, Pohang University of Science and Technology
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LEE Bong-Hoon
Electrical and Computer Engineering Division, Pohang University of Science and Technology
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JO Seong-Kue
Department of Electronic and Electrical Engineering and Microwave Application Research Center, Pohan
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Jo Seong-kue
Department Of Electronic And Electrical Engineering And Microwave Application Research Center Pohang
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Kim Dae
Magnachip Semiconductor Inc.
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Jeong Yoon-hee
Department Of Materials Science And Engineering Korea University
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AHN Ho-Young
Department of Physics and Research Center for Dielectric and Advanced Matter Physics,Pusan National
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JEONG Hee-Tae
Department of Physics and Research Center for Dielectric and Advanced Matter Physics,Pusan National
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CHO Yong-Chan
Department of Physics and Research Center for Dielectric and Advanced Matter Physics,Pusan National
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Jeong Hee-tae
Department Of Physics And Research Center For Dielectric And Advanced Matter Physics Pusan National
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Ahn Ho-young
Department Of Physics And Research Center For Dielectric And Advanced Matter Physics Pusan National
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Cho Yong-chan
Department Of Physics And Research Center For Dielectric And Advanced Matter Physics Pusan National
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Kim Dae
Korea Atomic Energy Research Institute
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LEE Jawoong
Korea Institute for Advanced Study
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Jeong Y‐h
Pohang Univ. Sci. And Tchnol. Pohang Kor
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Kim Byung-gyu
Department Of Electrical Engineering And Computer Science Korea Advanced Institute Of Science And Te
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Kim Byung-gyu
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Kim Dae-byung
Dept. Of Materials Engineering Korea University Of Technology And Education
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Sugano Takuo
Laboratory For Nano-electronics Materials Frontier Materials Research Program The Institute Of Physi
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Jeong Se-young
Department Of Nano-science And Technology Pusan National University
著作論文
- A Technique for Extracting Small-Signal Equivalent-Circuit Elements of HEMTs (Special Issue on High-Frequency/speed Devices in the 21st Century)
- Design Considerations for Low-Power Single-Electron Transistor Logic Circuits
- ED2000-59 / SDM2000-59 Calculation of Electrical Transport Properties for Novel Single Gated Single Electron Transistors
- ED2000-59 / SDM2000-59 Calculation of Electrical Transport Properties for Novel Single Gated Single Electron Transistors
- Effects of Sulfide Treatment on InP Metal-Insulator-Semiconductor Devices with Photochemical Vapor Deposit P_3N_5 Gate Insulators
- Thermal Properties at the Commensurate-Incommensurate Transition of K_2ZnCl_4
- Simple Experimental Determination of the Spread of Trapped Hot Holes Injected in Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Cells : Optimized Erase and Cell Shrinkage
- Spatial and Temporal Characterization of Programming Charge in SONOS Memory Cell : Effects of Localized Electron Trapping