Jeong Yoon-ha | Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
スポンサーリンク
概要
- 同名の論文著者
- Department Of Electronic And Electrical Engineering Pohang University Of Science And Technologyの論文著者
関連著者
-
JEONG Yoon-Ha
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
-
Jeong Yoon-ha
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
-
Kim D
Korea Institute For Advanced Study
-
Jeong Yoon-ha
Department Of Electrical And Electronic Engineering Pohang University Of Science And Technology
-
Jeong Yoon-Ha
Department of Creative IT Excellence Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Republic of Korea
-
KIM Dae
Korea institute for Advanced Study
-
KIM Dae
Department of Anatomy and Center for Advanced Medical Education by BK21 Project, Inha University Col
-
Jeong Y‐h
Pohang Univ. Sci. And Technol. Kyungpook Kor
-
Hwang S‐w
National Chiao Tung Univ. Hsinchu Twn
-
BAEK Chang-Ki
Korea Institute for Advanced Study
-
Jeong Moon-Young
Department of Electrical and Electronic Engineering Pohang University of Science and Technology
-
Jeong Moon-young
Department Of Electronic And Electrical Engineering Pohang University Of Science And Technology
-
Kim Dae
Department Of Anatomy And Center For Advanced Medical Education By Bk21 Project Inha University Coll
-
Kim Dae
Magnachip Semiconductor Inc.
-
Kim Dae
Korea Atomic Energy Research Institute
-
Kwon Wookhyun
Memory Division Semiconductor Business Samsung Electronics Company Ltd.
-
KIM Bomsoo
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology
-
Kim Dae-byung
Dept. Of Materials Engineering Korea University Of Technology And Education
-
HWANG Sung-Woo
School of Electrical Engineering, Korea University
著作論文
- Simple Experimental Determination of the Spread of Trapped Hot Holes Injected in Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Cells : Optimized Erase and Cell Shrinkage
- Performance of Single-Electron Transistor Logic Composed of Multi-gate Single-Electron Transistors