AOYAMA Takayuki | Semiconductor Leading Edge Technologies, Inc. (Selete)

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概要

• AOYAMA Takayukiの詳細を見る
• 同名の論文著者
• Semiconductor Leading Edge Technologies, Inc. (Selete)の論文著者

関連著者

• NARA Yasuo

  Semiconductor Leading Edge Technologies, Inc.

• Nara Yasuo

  Semiconductor Leading Edge Technologies Inc. (selete)

• AOYAMA Takayuki

  Semiconductor Leading Edge Technologies, Inc. (Selete)

• Nara Yasuo

  Semiconductor Leading Edge Technologies Inc.

• Aoyama Takayuki

  Semiconductor Leading Edge Technologies Inc. (selete)

• Aoyama Takayuki

  Semiconductor Leading Edge Technologies Inc.

• Aoyama Takayuki

  Semiconductor Leading Edge Technologies (Selete), Inc., Tsukuba, Ibaraki 305-8569, Japan

• MIYAZAKI Seiichi

  Hiroshima University

• Miyazaki Seiichi

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Miyazaki Seiichi

  Hiroshima Univ.

• INUMIYA Seiji

  Semiconductor Leading Edge Technologies, Inc.

• Inumiya Seiji

  Semiconductor Leading Edge Technologies Inc. (selete)

• Inumiya Seiji

  Semiconductor Company Toshiba Corporation

• SATO Motoyuki

  Semiconductor Leading Edge Technologies, Inc. (Selete)

• YAMADA Keisaku

  Waseda Univ.

• OHJI Yuzuru

  Semiconductor Leading Edge Technologies, Inc. (Selete)

• Miyazaki Seiichi

  Graduate School Of Advanced Sciences And Matters Hiroshima University

• Ohji Yuzuru

  Semiconductor Leading Edge Technol. Inc. (selete) Ibaraki Jpn

• Ohji Yuzuru

  Semiconductor & Integrated Circuits Division Hitachi Ltd.

• Yamada Keisaku

  Univ. Of Tsukuba

• Sato Motoyuki

  Semiconductor Leading Edge Technologies Inc. (selete)

• Miyazaki Seiichi

  Graduate School Of Engineering Nagoya University

• Shiraishi K

  Institute Of Physics University Of Tsukuba

• Eimori Takahisa

  Semiconductor Leading Edge Technologies Inc.

• Matsuki Takeo

  Semiconductor Leading Edge Technologies Inc. (selete)

• YAMABE Kikuo

  Univ. of Tsukuba

• SHIRAISHI Kenji

  Univ. of Tsukuba

• TAMURA Chihiro

  Univ. of Tsukuba

• HASUNUMA Ryu

  Univ. of Tsukuba

• UEDONO Akira

  Univ. of Tsukuba

• OHTSUKA Shingo

  Semiconductor Leading Edge Technologies, Inc. (Selete)

• WADA Tetsunori

  Semiconductor Leading Edge Technologies, Inc. (Selete)

• Yamamoto K

  Univ. Of Tsukuba

• Yamamoto K

  Kaneka Corporation

• Ohtsuka Shingo

  Semiconductor Leading Edge Technologies Inc. (selete)

• Wada Tetsunori

  Semiconductor Leading Edge Technologies Inc. (selete)

• Yamada Keisaku

  Graduate School Of Pure And Applied Sciences University Of Tsukuba

• Yamamoto K

  Photonics Research Institute National Institute Of Advanced Industrial Science And Technology (aist)

• ONIZAWA Takashi

  Semiconductor Leading Edge Technologies, Inc.

• Yamada Keisaku

  Nanotechnology Research Laboratories Waseda University

• Onizawa Takashi

  Semiconductor Leading Edge Technologies Inc.

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著作論文

• Comprehensive Understanding of PBTI and NBTI reliability of High-k / Metal Gate Stacks with EOT Scaling to sub-1nm
• Mechanism of Threshold Voltage Reduction and Hole Mobility Enhancement in pMOSFETs Employing Sub-1nm EOT HfSiON by Use of Substrate Fluorine Ion Implantation
• Performance and Reliability Improvement by Optimized Nitrogen Content of TaSiNx Metal Gate in Metal/HfSiON nFETs

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