Ohji Yuzuru | Semiconductor Leading Edge Technol. Inc. (selete) Ibaraki Jpn
スポンサーリンク
概要
関連著者
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NARA Yasuo
Semiconductor Leading Edge Technologies, Inc.
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Nara Yasuo
Semiconductor Leading Edge Technologies Inc. (selete)
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SATO Motoyuki
Semiconductor Leading Edge Technologies, Inc. (Selete)
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AOYAMA Takayuki
Semiconductor Leading Edge Technologies, Inc. (Selete)
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OHJI Yuzuru
Semiconductor Leading Edge Technologies, Inc. (Selete)
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Ohji Yuzuru
Semiconductor Leading Edge Technol. Inc. (selete) Ibaraki Jpn
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Ohji Yuzuru
Semiconductor & Integrated Circuits Division Hitachi Ltd.
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Nara Yasuo
Semiconductor Leading Edge Technologies Inc.
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Sato Motoyuki
Semiconductor Leading Edge Technologies Inc. (selete)
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Aoyama Takayuki
Semiconductor Leading Edge Technologies Inc. (selete)
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Aoyama Takayuki
Semiconductor Leading Edge Technologies Inc.
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Aoyama Takayuki
Semiconductor Leading Edge Technologies (Selete), Inc., Tsukuba, Ibaraki 305-8569, Japan
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MIYAZAKI Seiichi
Hiroshima University
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Shiraishi K
Institute Of Physics University Of Tsukuba
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Miyazaki Seiichi
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Miyazaki Seiichi
Hiroshima Univ.
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INUMIYA Seiji
Semiconductor Leading Edge Technologies, Inc.
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Inumiya Seiji
Semiconductor Leading Edge Technologies Inc. (selete)
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Inumiya Seiji
Semiconductor Company Toshiba Corporation
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Eimori Takahisa
Semiconductor Leading Edge Technologies Inc.
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YAMABE Kikuo
Univ. of Tsukuba
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SHIRAISHI Kenji
Univ. of Tsukuba
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YAMADA Keisaku
Waseda Univ.
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TAMURA Chihiro
Univ. of Tsukuba
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HASUNUMA Ryu
Univ. of Tsukuba
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Yamamoto K
Univ. Of Tsukuba
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Yamamoto K
Kaneka Corporation
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Miyazaki Seiichi
Graduate School Of Advanced Sciences And Matters Hiroshima University
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Yamada Keisaku
Graduate School Of Pure And Applied Sciences University Of Tsukuba
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Yamamoto K
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology (aist)
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ONIZAWA Takashi
Semiconductor Leading Edge Technologies, Inc.
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Yamada Keisaku
Nanotechnology Research Laboratories Waseda University
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Yamada Keisaku
Univ. Of Tsukuba
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Onizawa Takashi
Semiconductor Leading Edge Technologies Inc.
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Miyazaki Seiichi
Graduate School Of Engineering Nagoya University
著作論文
- Comprehensive Understanding of PBTI and NBTI reliability of High-k / Metal Gate Stacks with EOT Scaling to sub-1nm
- Performance and Reliability Improvement by Optimized Nitrogen Content of TaSiNx Metal Gate in Metal/HfSiON nFETs