Optical Constants of $\beta$-FeSi2 Film on Si Substrate Obtained from Transmittance and Reflectance Data and Origin of Urbach Tail
スポンサーリンク
概要
- 論文の詳細を見る
$\beta$-FeSi2 film was prepared on a Si(001) substrate by molecular beam epitaxy using an Fe source. The crystallinity and crystallographic orientation of $\beta$-FeSi2 film on the Si(001) substrate was characterized by X-ray diffraction analysis. Optical constants and the onset of the band-edge absorption of $\beta$-FeSi2 film on the Si(001) substrate were evaluated by solving simultaneous equations of reflectance and transmittance data. The extinction coefficient calculated using simultaneous equations showed abrupt absorption at the band-edge.
- 2007-04-30
著者
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SHIBATA Hajime
National Institute of Advanced Industrial Science and Technology
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Wada Satoshi
Graduate School Of Fisheries Sciences Hokkaido University
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Higuchi Tohru
Department Of Applied Physics Faculty Of Science Tokyo Univ. Of Science
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Kakemoto Hirofumi
Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
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Tsurumi Takaaki
Graduate School of Materials Science and Technology, Tokyo Institute of Technology, Meguro, Tokyo 152-8552, Japan
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Higuchi Tohru
Department of Applied Physics, Faculty of Science, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku, Tokyo 162-8601, Japan
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Kanemoto Hirofumi
Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
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