Noise Reduction of Microwave Dielectric Map using Fourier Analysis Refinement
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概要
- 論文の詳細を見る
An in-plane reflection intensity map indicating a dielectric map of the cross-section of a multi-layer ceramic capacitor was measured in the reflection intensity minimum position using a microwave probe at 9.4 GHz. The dielectric map showed the inner dielectric layers and electrodes of the cross-section of the multi-layer ceramic capacitor. Noise reduction for the obtained dielectric map was carried out by Fourier analysis refinement using measurement data of BaTiO3 ceramics as the parameters of the point spread function. The inner dielectric layers and electrodes of the cross-section of the multi-layer ceramic capacitor were presented clearly, and the origin of noise was elucidated as a result of the Fourier analysis refinement.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-10-30
著者
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KAKEMOTO Hirofumi
Graduate School of Science and Engineering, Tokyo Institute of Technology
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Nam Song-Min
Department of Inorganic Materials, Graduate School of Science and Engineering, Tokyo Institute of Te
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Wada Satoshi
Interdisciplinary Graduate School of Medical and Engineering, University of Yamanashi
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Tsurumi Takaaki
Graduate School Of Science And Engineering Tokyo Institute Of Technology
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Harigai Takakiyo
Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
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Li Jianyong
Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
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Nam Song-Min
Department of Electronic Materials Engineering, Kwangwoon University, 447-1 Wolgye-dong, Nowon-gu, Seoul 139-701, Korea
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Tsurumi Takaaki
Graduate School of Materials Science and Technology, Tokyo Institute of Technology, Meguro, Tokyo 152-8552, Japan
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Wada Satoshi
Interdisciplinary Graduate School of Material Science and Technology, University of Yamanashi, 4-3-11 Takeda, Kofu 400-8511, Japan
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