Evaluation of Carrier Dynamics in $n$-AlxGa1-xAs Films by Terahertz Time-Domain Spectroscopy with Characteristic-Matrix Analysis
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概要
- 論文の詳細を見る
The optical transmittances of rather simple multilayered samples incorporating $n$-AlxGa1-xAs ($x=0$ and 0.4) films were measured by THz time-domain spectroscopic method. The frequency dependencies of such transmittances are well reproduced by characteristic-matrix calculation under an assumption of Drude conductivity in the films. The characteristic matrix is a powerful tool for the optical characterization of multilayered systems in the THz range.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2004-10-15
著者
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Kitagawa Jiro
Department Of Quantum Matter Adsm Hiroshima University
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Kadoya Yutaka
Department Of Materials Processing Engineering Graduate School Of Engineering Nagoya University
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HARIMOCHI Hiroyuki
Department of Quantum Matter, ADSM, Hiroshima University
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Yamanishi Masamichi
Department Of Electrical Engineering College Of Engineering University Of Osaka Prefecture
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Yamanishi Masamichi
Department of Quantum Matter, ADSM, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8530, Japan
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Kadoya Yutaka
Department of Quantum Matter, ADSM, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8530, Japan
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Kitagawa Jiro
Department of Electrical Engineering, Faculty of Engineering, Fukuoka Institute of Technology, Fukuoka 811-0295, Japan
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