Optical Properties of the SiO–Co Composite Thin Films
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概要
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Spectroscopic ellipsometry (SE) and X-ray photoelectron spectroscopy (XPS) were employed to study the composite thin films of SiO and cobalt (Co) prepared by sputtering technique. The optical properties of these films could be expressed as mixtures of SiO and Co using effective medium approximation (EMA) by Bruggeman. When the compositional properties of films analyzed by EMA and XPS were compared, the optical volume of SiO was found to be 5.47 times greater than that of Co.
- 2003-03-15
著者
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Kim Ok-kyung
Department Of Physics Hanyang University
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An Ilsin
Department Of Applied Physics Hanyang University
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Lee Jaeho
Department Of Biomaterial Science College Of Natural Resources & Life Science Pusan National Uni
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Oh Hye-keun
Department Of Applied Physics Hanyang University
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Choi Chaungi
Corporated R&d Center Samsung Sdi Co. Ltd.
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Park Chang-won
Corporated R&d Center Samsung Sdi Co. Ltd.
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Bang Kyoung-yoon
Department Of Physics Hanyang University
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Bang Kyoung-Yoon
Department of Physics, Hanyang University, Ansan 425-791, Korea
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Oh Hye-Keun
Department of Physics, Hanyang University, Ansan 425-791, Korea
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Lee Jaeho
Department of Physics, Hanyang University, Ansan 425-791, Korea
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An Ilsin
Department of Physics, Hanyang University, Ansan 425-791, Korea
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Kim Ok-Kyung
Department of Physics, Hanyang University, Ansan 425-791, Korea
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Choi Chaungi
Corporated R&D Center, Samsung SDI Co., Ltd., Youngin 442-902, Korea
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