An Annealing Stage near 4.2 K in Neutron Irradiated Germanium
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1975-01-05
著者
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Tagawa Seiichi
Nuclear Engineering Research Lab. Fac. Of Engineering Univ. Of Tokyo
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Saito Haruo
College Of General Education Osaka University
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Tagawa Seiichi
Nuclear Engineering Research Laboratory Faculty Of Engineering The University Of Tokyo
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Tatsumi Yukichi
College Of General Education Osaka University
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Fukuoka Noboru
College Of General Education Osaka University
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Fukuoka Noboru
Department Of Physics College Of General Education Osaka Univ.
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HIRATA Mitsuji
College of General Education, Osaka University
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SASUGA Norihiko
Nuclear Engineering Research Laboratory, Faculty of Engineering, The University of Tokyo
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Hirata Mitsuji
College Of General Education Osaka University
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Sasuga Norihiko
Nuclear Engineering Research Laboratory Faculty Of Engineering The University Of Tokyo
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Saito Haruo
Department Of Physics College Of General Education Osaka Univ.
関連論文
- Property of Radiation-Induced Defects in Germanium Single Crystals
- Radiation Defects in Thermal-Donor-Doped Silicon
- Radiation Defects Produced by Neutron Irradiation in Germanium Single Crystals
- Nature of Oxygen Donors and Radiation Defects in Oxygen-Doped Germanium
- Effects of Carbon Atoms on the Defects in Czochralski-Grown Silicon Formed by Annealing
- Defects Produced in Germanium by Quenching and Electron Irradiation
- Point Defects in Cubic Boron Nitride after Neutron Irradiation
- Electron Paramagnetic Center in Neutron-Irradiated AlN
- F-Type Centers in Neutron-Irradiated AIN
- An Annealing Stage near 4.2 K in Neutron Irradiated Germanium
- Annealing of Defects Formed in Germanium After Irradiations with Particles of Various Energies
- The E_c-0.2 eV Level in Irradiated n-Type Germanium
- Shallow Traps in p-Type Germanium Converted from n-Type by Electron Irradiation
- 80°K -140°K Annealing Stage of p-Type Germanium after Irradiation with 1.5 Me V Electrons at 77°K
- Temperature Dependence of the Lifetime of the 1Σ^+_u State of STE in KI, NaCl, KBr and RbBr Crystals
- Formation Time of STE at ^1Σ^+_u State in RbBr and KI under Pulsed Electron Beam in Picosecond Range
- Effects of Gamma Irradiation on Minority Carrier Lifetime in Germanium Single Crystals
- Nature of Radiation Defects in Silicon Single Crystals
- Radiation Defects in n-Type Germanium Studied by Deep Level Transient Spectroscopy
- Defect States in n-Type Germanium Irradiated with 1.5 MeV Electrons
- Oxygen-Related Defects in Irradiated Germanium
- Substitution of Impurity Atoms by Self-Interstitials in Thermal Neutron Irradiated Germanium
- Annealing of Self-Interstitials in Germanium
- New Donor Formation in n-Type Czochralski-Grown Silicon
- Thermal Donor Formation and the Effect of Copper Contamination in Oxygen-Doped Germanium : Semiconductors and Semiconductor Devices
- The Defects Produced by Electron Irradiation and Annealed at About 360K in n-Type Germanium
- Annealing of E Center in Irradiated Silicon
- Radiation Induced Defects in Germaniumt Single Crystals of High Purity
- Defects in Carbon-Implanted Silicon
- Defects in Neutron-Transmutation-Doped Germanium
- Radiation field for fisson neutron enhanced boron neutron capture therapy employing fast neutron source reactor "YAYOI".