Strong Flux Pinning by Cracks in Films of Superconducting Oxide : Electrical Properties of Condensed Matter
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概要
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The possibility of flux pinning by cracks along basal planes in single-crystalline films of a superconducting oxide is theoretically investigated. For a single-crystalline film with the c-axis parallel to a substrate, the transport current can flow along the basal plane without an influence of the cracks, while the cracks act as strong pinning centers that prevent fluxoids from moving along the c-axis due to the Lorentz force. The critical current density in YBaCuO at T=77 K and B=5 T is estimated as 1.7×10^<10> A / m^2 in the case of a mean interval of the cracks of 50 nm. This value is larger than that in Nb_3Sn at 4.2 K.
- 社団法人応用物理学会の論文
- 1988-09-20
著者
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MATSUSHITA Teruo
Department of Computer Science and Electronics, Kyushu Institute of Technology
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Matsushita Teruo
Department Of Electronics Faculty Of Engineering Kyusyu University
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Matsushita Teruo
Department Of Computer Science And Electronics Kyushu Institute Of Technology
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