Ballistic Electron Emission Microscopy Studies of Inhomogeneity in Au/CaF_2/n-Si(111) Interfaces

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概要

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• We have perfromed ballistic electron emission microscopy (BEEM) measurements on the Au/CaF_2/n-Si(111) system in which calcium fluoride (CaF_2)(about 2 monolayers (ML)) was introduced at the Au/Si interface. A BEEM image cleary shows the coexistence of two types of terrace for each of which the BEEM I-V spectrum has a different shape. A typical threshold voltage of the BEEM current for one type is about 0.75V. In contrast, the second type shows a threshold voltage of about 3.5V, which is much higher than the value of the first type. Furthermore, the BEEM current on the second type is significantly reduced and saturates above about 6V. We attribute the coexistence of the two types of terrace in the BEEM image to the different degrees of coverage of the CaF_2 intralayers between them. At the second type of terrace, a Au/2ML CaF_2/1ML CaF/Si(111) interface exists, although the first type has a Au/1ML CaF/Si(111) interface without a CaF_2 intralayer.

• 社団法人応用物理学会の論文
• 1997-08-01

著者

• MIURA Tatsuro

  Department of Applied Physics, Graduate School of Engineering, Tohoku University

• Miura T

  Department Of Electrical & Electronic Engineering Yamaguchi University

• SUMIYA Touru

  Tanaka Solid Junction Project, Japan Science and Technology Corporation

• FUJINUMA Haruko

  Tanaka Solid Junction Project, Japan Science and Technology Corporation

• MIURA Tadao

  Tanaka Solid Junction Project, Japan Science and Technology Corporation

• TANAKA Shun-ichiro

  Tanaka Solid Junction Project, Japan Science and Technology Corporation

• Tanaka Shun-ichiro

  Tanaka Solid Junction Project Erato Japan Science And Technology Corporation

• Sumiya Touru

  Tanaka Solid Junction Project Japan Science And Technology Corporation

• Fujinuma H

  Tanaka Solid Junction Project Japan Science And Technology Corporation

• Tanaka Shun-ichiro

  Tanaka Solid Junction Project, ERATO, Japan Science and Research Corporation

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