Thermal Conductivity Measurement of Si/(Ge+Au) Artificial Superlattice Thin Film
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概要
- 論文の詳細を見る
The thermal conductivity of an amorphous Si/(Ge+Au) superlattice thin film was successfully measured using a photo-thermal-reflectance method. The measured thermal conductivity was very small, about 5% of the conductivity of conventional bulk crystalline SiGe. This would increase the figure of merit $Z$ ($=\alpha^{2}\rho^{-1}\kappa^{-1}$), which describes the performance of thermoelectric materials, by a factor of 20 relative to previously reported values.
- Japan Society of Applied Physicsの論文
- 2008-11-25
著者
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OKAMOTO Yoichi
Department of Materials Science and Engineering, National Defense Academy
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TAKIGUCHI Hiroaki
Department of Materials Science and Engineering, National Defense Academy
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Takiguchi Hiroaki
Department Of Materials Science And Engineering National Defense Academy
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Okamoto Yoichi
Department Of Applied Physics National Defense Academy
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Saeki Junichi
Bethel Co., Ltd., Aragane, Ishioka, Ibaraki 315-0021, Japan
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Ohtsuki Tetsunari
Bethel Co., Ltd., Aragane, Ishioka, Ibaraki 315-0021, Japan
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Saeki Junichi
Bethel Co. Ltd.
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Ohtsuki Tetsunari
Bethel Co. Ltd.
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