Fowler-Nordheim Tunneling in Electromigrated Break Junctions with Porphyrin Derivatives
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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久保田 徹
情報通信研究機構未来ictセンター
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野口 裕
千葉大先端セ
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野口 祐二
Univ. Tokyo Tokyo Jpn
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Noguchi Yutaka
Department Of Machine Intelligence And System Engineering Intelligent System Design Laboratory Tohok
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Kubota T
Department Of Chemistry Graduate School Of Science The University Of Tokyo
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NOGUCHI Yutaka
Advanced ICT Research Center, National Institute of Information and Communications Technology
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NAGASE Takashi
Advanced ICT Research Center, National Institute of Information and Communications Technology
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UEDA Rieko
Advanced ICT Research Center, National Institute of Information and Communications Technology
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KAMIKADO Toshiya
Advanced ICT Research Center, National Institute of Information and Communications Technology
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KUBOTA Tohru
Advanced ICT Research Center, National Institute of Information and Communications Technology
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MASHIKO Shinro
Advanced ICT Research Center, National Institute of Information and Communications Technology
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Nagase Takashi
Kansai Advanced Research Center, National Institute of Information and Communication Technology
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Ueda Rieko
Kansai Advanced Research Center, National Institute of Information and Communication Technology
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Mashiko Shinro
Kansai Advanced Research Center, National Institute of Information and Communication Technology
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Kubota Tadahiro
Department Of Electronic Engineering Faculty Of Engineering Tokyo Denki University
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Mashiko Shinro
Kansai Advanced Research Center National Institute Of Information And Communication Technology
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Mashiko Shinro
Communications Research Laboratory Ministry Of Posts And Telecommunications Kansai Advanced Research
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Kamikado Toshiya
Advanced Ict Research Center National Institute Of Information And Communications Technology
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Ueda Rieko
Kansai Advanced Research Center National Institute Of Information And Communication Technology
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Nagase Takashi
Kansai Advanced Research Center National Institute Of Information And Communication Technology
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Kubota Takeshi
Niihama National College Of Technology
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