Electronic Structure in Valence Band of Nd-Substituted Bi_4Ti_3O_<12> Single Crystal Probed by Soft-X-Ray Emission Spectroscopy
スポンサーリンク
概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2005-12-10
著者
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宮山 勝
東大 先端科学技術研究セ
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SHIN Shik
Institute for Solid State Physics, University of Tokyo
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Higuchi T
Department Of Applied Physics Tokyo University Of Science
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TSUKAMOTO Takeyo
Department of Applied Physics, Tokyo University of Science
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Kobayashi K
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Noguchi Yutaka
Department Of Machine Intelligence And System Engineering Intelligent System Design Laboratory Tohok
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Shin S
Riken/spring-8
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Shin S
Institute For Solid State Physics University Of Tokyo
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HIGUCHI Tohru
Department of Applied Physics, Tokyo University of Science
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NOGUCHI Yuji
Research Center for Advanced Science and Technology, University of Tokyo
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GOTO Takashi
Research Center for Advanced Science and Technology, University of Tokyo
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MIYAYAMA Masaru
Research Center for Advanced Science and Technology, University of Tokyo
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KANEDA Kazuhiro
Department of Applied Physics, Tokyo University of Science
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HATTORI Takeshi
Department of Applied Physics, Tokyo University of Science
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Hattori T
Department Of Applied Physics Tokyo University Of Science
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