Ultra-Shallow p+/n Junction Prepared by Low Energy BF_3 Plasma Doping(PLAD) and KrF Excimer Laser Annealing
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Heo Sungho
Department Of Materials Science And Engineering Gwangju Institute Of Science And Technology
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Lee Dongkyu
Department Of Materials Science And Engineering Gwangju Institute Of Science And Technology
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Hwang Hyunsang
Gwangju Inst. Sci. And Technol. Gwangju Kor
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BAEK Sungkweon
Gwangju Institute of Science and Technology
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Baek Sungkweon
Samsung Electronics Co. Ltd.
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LEE Dongkyu
Gwangju Institute of Science & Technology (GIST), Dept. of Materials Sci. & Eng.
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CHO Changhee
Gwangju Institute of Science & Technology (GIST), Dept. of Materials Sci. & Eng.
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HEO Sungho
Gwangju Institute of Science & Technology (GIST), Dept. of Materials Sci. & Eng.
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Cho Changhee
Gwangju Institute Of Science & Technology (gist) Dept. Of Materials Sci. & Eng.
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Hwang Hyunsang
Gwangju Inst. Sci. And Technol. (gist) Gwangju Kor
関連論文
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- Stress voltage polarity dependent threshold voltage shift behavior of ultrathin Hafnium oxide gated pMOSFET with TiN electrode
- Ultrashallow Arsenic n^+/p Junction Formed by AsH_3 Plasma Doping
- Effective Work Function of Scandium Nitride Gate Electrodes on SiO_2 and HfO_2
- Ultrashallow Arsenic n〔+〕/p Junction Formed by AsH3 Plasma Doping
- Ultra-Shallow p+/n Junction Prepared by Low Energy BF_3 Plasma Doping(PLAD) and KrF Excimer Laser Annealing
- The origin of slow and fast trapping under Bias Temperature Instability in HfSiO MOSFET
- Improved Conductance Method for Determining Interface Trap Density of Metal-Oxide-Semiconductor Device with High Series Resistance
- Effect of Capacitance-Voltage Sweep on the Flat-Band Voltage of Metal-Oxide-Semiconductor Device with High-k Gate Dielectric
- Ultrashallow Junction Formation Using Novel Plasma Doping Technology beyond 50 nm MOS Devices
- Fabrication of 50 nm Trigate Silicon On Insulator Metal–Oxide–Silicon Field-Effect Transistor without Source/Drain Activation Annealing
- Effective Work Function of Scandium Nitride Gate Electrodes on SiO2 and HfO2
- Ultrashallow Arsenic n+/p Junction Formed by AsH3 Plasma Doping