Study of Temperature Dependent Local Structure by Polarized Cu K-edge EXAFS Measurements on La_<2-x>Sr_xCuO_4 (x=0.105, 0.13, 0.20)
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概要
- 論文の詳細を見る
- 2003-04-15
著者
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ITO Toshimitsu
National Institute of Advanced Industrial Science and Technology
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Oizumi H
Electrotechnical Laboratory
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Ito Toshimitsu
National Institute For Advanced Industrial Science And Technology
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Bianconi A
Unita Infm And Dipartimento Di Fisica Universita Di Roma "la Sapienza
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Scagnoli Valerio
Unita Infm And Dipartimento Di Fisica Universita Di Roma "la Sapienza
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Ito Toshimitsu
Electrotechnical Laboratory
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OKA Kunihiko
Electrotechnical Laboratory
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Saini N
Unita Infm And Dipartimento Di Fisica Universita Di Roma "la Sapienza
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OKA Kunihiko
National Institute of Advanced Industrial Science and Technology
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SAINI Naurang
Unita INFM and Dipartimento di Fisica, Universita di Roma "La Sapienza"
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OYANAGI Hiroyuki
National Institute for Advanced Industrial Science and Technology
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BIANCONI Antonio
Unita INFM and Dipartimento di Fisica, Universita di Roma "La Sapienza"
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Oyanagi Hiroyuki
Optoelectronics Division Electrotechnical Laboratory
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Saini Naurang
Unita Infm And Dipartimento Di Fisica Universita Di Roma "la Sapienza
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Oka Kunihiko
National Institute For Advanced Industrial Science And Technology
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Oyanagi H
Optoelectronics Division Electrotechnical Laboratory
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