Miyaji Kousuke | Institute Of Industrial Science University Of Tokyo
スポンサーリンク
概要
関連著者
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Hiramoto Toshiro
Institute Of Industrial Science The University Of Tokyo
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Miyaji Kousuke
Institute Of Industrial Science University Of Tokyo
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HIRAMOTO Toshiro
Institute Industrial Science, The University of Tokyo
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Hiramoto Toshiro
Institute Of Industrial Science University Of Tokyo
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Hiramoto T
Univ. Tokyo
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MIYAJI Kousuke
Institute of Industrial Science, University of Tokyo
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Hiramoto Toshiro
The Authors Are With Institute Of Industrial Science The University Of Tokyo:the Author Is With Vlsi
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Hiramoto Toshiro
Vlsi Design And Education Center The University Of Tokyo:institute Of Industrial Science The Univers
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Hiramoto Toshiro
Inst. Of Industrial Science And Cinqie University Of Tokyo
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Hiramoto Toshiro
Vlsi Design And Education Center The University Of Tokyo
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SAITOH Masumi
Toshiba Corporation
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Saitoh Masumi
Advanced Lsi Technology Laboratory Corporate R&d Center Toshiba Corporation
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Saitoh Masumi
Institute Of Industrial Science University Of Tokyo
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Kobayashi Masaharu
Institute Of Industrial Science University Of Tokyo
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Nagumo Toshiharu
Institute Of Industrial Science The University Of Tokyo
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SAITOH Masumi
Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation
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SAITOH Masumi
Institute of Industrial Science, University of Tokyo
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NAGUMO Toshiharu
Institute of Industrial Science, University of Tokyo
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KOBAYASHI Masaharu
Institute of Industrial Science, University of Tokyo
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Nagumo Toshiharu
Institute Of Industrial Science University Of Tokyo
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Miyaji Kousuke
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Chen Jiezhi
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Saraya Takura
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
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Shimizu Ken
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
著作論文
- Very Sharp Room-Temperature Negative Differential Conductance in Silicon Single-Hole Transistor with High Voltage Gain
- Temperature Dependence of Off-Current in Bulk and FD SOI MOSFETs
- Charge Polarity Dependence of Negative Differential Conductance in Room-Temperature Operating Silicon Single-Charge Transistors
- Room Temperature Demonstration of Variable Full Width at Half Maximum of Coulomb Oscillation in Silicon Single-Hole Transistor
- Temperature Dependence of Off-Current in Bulk and Fully Depleted SOI MOSFETs
- On the Origin of Negative Differential Conductance in Ultranarrow-Wire-Channel Silicon Single-Electron and Single-Hole Transistors
- Electron Mobility in Silicon Gate-All-Around [100]- and [110]-Directed Nanowire Metal–Oxide–Semiconductor Field-Effect Transistor on (100)-Oriented Silicon-on-Insulator Substrate Extracted by Improved Split Capacitance–Voltage Method