MIYAJI Kousuke | Institute of Industrial Science, University of Tokyo

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概要

• MIYAJI Kousukeの詳細を見る
• 同名の論文著者
• Institute of Industrial Science, University of Tokyoの論文著者

関連著者

• Hiramoto Toshiro

  Institute Of Industrial Science University Of Tokyo

• MIYAJI Kousuke

  Institute of Industrial Science, University of Tokyo

• Hiramoto Toshiro

  Institute Of Industrial Science The University Of Tokyo

• Hiramoto T

  Univ. Tokyo

• Hiramoto Toshiro

  The Authors Are With Institute Of Industrial Science The University Of Tokyo:the Author Is With Vlsi

• Hiramoto Toshiro

  Vlsi Design And Education Center The University Of Tokyo:institute Of Industrial Science The Univers

• Hiramoto Toshiro

  Inst. Of Industrial Science And Cinqie University Of Tokyo

• Hiramoto Toshiro

  Vlsi Design And Education Center The University Of Tokyo

• Miyaji Kousuke

  Institute Of Industrial Science University Of Tokyo

• SAITOH Masumi

  Institute of Industrial Science, University of Tokyo

• SAITOH Masumi

  Toshiba Corporation

• NAGUMO Toshiharu

  Institute of Industrial Science, University of Tokyo

• Saitoh Masumi

  Advanced Lsi Technology Laboratory Corporate R&d Center Toshiba Corporation

• HIRAMOTO Toshiro

  Institute Industrial Science, The University of Tokyo

• SAITOH Masumi

  Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation

• KOBAYASHI Masaharu

  Institute of Industrial Science, University of Tokyo

• Saitoh Masumi

  Institute Of Industrial Science University Of Tokyo

• Kobayashi Masaharu

  Institute Of Industrial Science University Of Tokyo

• Nagumo Toshiharu

  Institute Of Industrial Science The University Of Tokyo

• Nagumo Toshiharu

  Institute Of Industrial Science University Of Tokyo

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著作論文

• Very Sharp Room-Temperature Negative Differential Conductance in Silicon Single-Hole Transistor with High Voltage Gain
• Temperature Dependence of Off-Current in Bulk and Fully Depleted SOI MOSFETs
• Temperature Dependence of Off-Current in Bulk and FD SOI MOSFETs
• Charge Polarity Dependence of Negative Differential Conductance in Room-Temperature Operating Silicon Single-Charge Transistors
• Room Temperature Demonstration of Variable Full Width at Half Maximum of Coulomb Oscillation in Silicon Single-Hole Transistor

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