Mertens P | Interuniversity Microelectronics Center
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概要
関連著者
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Mertens P
Interuniversity Microelectronics Center
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Heyns M
Interuniv. Microelectronics Center Leuven Bel
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MERTENS Paul
Interuniversitair Micro-Electronica Centrum
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WOERLEE Pierre
University of Twente
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Mertens Paul
Interuniversity Microelectronics Center
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Heyns Marc
Interuniversity Microelectronics Centre
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BEARDA Twan
Interuniversitary Micro-Electronics Center
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Bearda T
Interuniv. Microelectronics Center Leuven Bel
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Heyns Marc
Interuniversitary Micro-Electronics Center
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SCHMOLKE Rudiger
Wacker Siltronic AG
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WALLINGA Hans
University of Twente
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MEURIS Marc
IMEC vzw
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Schmolke R
Wacker Siltronic Ag
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MERTENS Paul
IMEC
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HEYNS Marc
IMEC
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Hatcher Zach
Ashland Chemical
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Depas Michel
Imec Vzw
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Maes H
Interuniversitair Micro-electronica Centrum
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Gendt Stefan
Imec Vzw
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MAES Herman
Interuniversity Microelectronics Center (IMEC)
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SCHMOLKE Rudiger
Interuniversity Microelectronics Center
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KNOTTER D.
Philips Research
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KENIS Karine
IMEC vzw
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MERTENS Paul
IMEC vzw
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HEYNS Marc
IMEC vzw
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Schmidt Harald
IMEC
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Rotondaro Antonio
IMEC
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Hurd Trace
Texas Instruments
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De Gendt
Imec Kapeldreef
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Hurd Trace
Texas Instruments:(present Address)imec
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Meuris Marc
Imec
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Maes Herman
Interuniversitair Micro-electronica Centrum
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Knotter D.Martin
Philips Research
著作論文
- Stress in Thin Micro-Zone-Molten Crystalline Silicon Films on Solid Substrates
- Current-Voltage Characteristics of Gate Oxides after Hard Breakdown
- Morphology Change of Artificial Crystal Originated Particles, and the Effect on Gate Oxide Integrity
- Breakdown and Recovery of Thin Gate Oxides
- Fabrication and Characterization of Artificial Crystal Originated Particles
- Impact of Organic Contamination on Thin Gate Oxide Quality
- H_2O_2 Decomposition and Its Impact on Silicon Surface Roughening and Gate Oxide Integrity