Depas Michel | Imec Vzw

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概要

• 同名の論文著者
• Imec Vzwの論文著者

関連著者

• Depas Michel

  Imec Vzw

• HEYNS Marc

  IMEC

• Degraeve Robin

  Imec

• Heyns Marc

  Interuniversity Microelectronics Centre

• Nigam Tanya

  Imec

• Heyns M

  Imec Leuven Bel

• GROESENEKEN Guido

  IMEC

• DEPAS Michel

  Interuniversity Microelectronics Centre

• Depas Michel

  IMEC

• Mertens P

  Interuniversity Microelectronics Center

• Heyns M

  Interuniv. Microelectronics Center Leuven Bel

• Gendt Stefan

  Imec Vzw

• KNOTTER D.

  Philips Research

• KENIS Karine

  IMEC vzw

• MEURIS Marc

  IMEC vzw

• MERTENS Paul

  IMEC vzw

• HEYNS Marc

  IMEC vzw

• DEGRAEVE Robin

  Interuniversity Microelectronics Centre

• NIGAM Tanya

  Interuniversity Microelectronics Centre

• GROESENEKEN Guido

  Interuniversity Microelectronics Centre

• De Gendt

  Imec Kapeldreef

• Heyns Marc

  Interuniversitary Micro-Electronics Center

• Knotter D.Martin

  Philips Research

もっと見る 閉じる

著作論文

• Impact of Organic Contamination on Thin Gate Oxide Quality
• Gate Voltage Dependence of Reliability for Ultra-Thin Oxides
• Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime
• Reliability of Ultra-Thin Gate Oxides Below 3nm in the Direct Tunneling Regime

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