Degraeve Robin | Imec

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概要

• DEGRAEVE Robinの詳細を見る
• 同名の論文著者
• Imecの論文著者

関連著者

• Degraeve Robin

  Imec

• Nigam Tanya

  Imec

• GROESENEKEN Guido

  IMEC

• HEYNS Marc

  IMEC

• Depas Michel

  Imec Vzw

• Heyns Marc

  Interuniversity Microelectronics Centre

• Heyns M

  Imec Leuven Bel

• DEPAS Michel

  Interuniversity Microelectronics Centre

• Depas Michel

  IMEC

• DEGRAEVE Robin

  Interuniversity Microelectronics Centre

• NIGAM Tanya

  Interuniversity Microelectronics Centre

• GROESENEKEN Guido

  Interuniversity Microelectronics Centre

• MAES Herman

  IMEC, the Katholieke Universiteit of Lsuven (kul)

• Crupi Felice

  Imec:(present Address)department Of Information Engineering University Of Pisa

• Maes Herman

  Imec

• Heyns Marc

  Interuniversitary Micro-Electronics Center

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著作論文

• Gate Voltage Dependence of Reliability for Ultra-Thin Oxides
• Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime
• Reliability of Ultra-Thin Gate Oxides Below 3nm in the Direct Tunneling Regime
• Investigation and Comparison of the Noise in the Gate and Substrate Current after Soft-Breakdown

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