DEGRAEVE Robin | Interuniversity Microelectronics Centre
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概要
関連著者
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DEPAS Michel
Interuniversity Microelectronics Centre
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DEGRAEVE Robin
Interuniversity Microelectronics Centre
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NIGAM Tanya
Interuniversity Microelectronics Centre
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GROESENEKEN Guido
Interuniversity Microelectronics Centre
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Heyns Marc
Interuniversitary Micro-Electronics Center
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HEYNS Marc
IMEC
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Degraeve Robin
Imec
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Depas Michel
Imec Vzw
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Heyns Marc
Interuniversity Microelectronics Centre
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Nigam Tanya
Imec
著作論文
- Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime
- Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime