DEGRAEVE Robin | Interuniversity Microelectronics Centre

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概要

• 同名の論文著者
• Interuniversity Microelectronics Centreの論文著者

関連著者

• DEPAS Michel

  Interuniversity Microelectronics Centre

• DEGRAEVE Robin

  Interuniversity Microelectronics Centre

• NIGAM Tanya

  Interuniversity Microelectronics Centre

• GROESENEKEN Guido

  Interuniversity Microelectronics Centre

• Heyns Marc

  Interuniversitary Micro-Electronics Center

• HEYNS Marc

  IMEC

• Degraeve Robin

  Imec

• Depas Michel

  Imec Vzw

• Heyns Marc

  Interuniversity Microelectronics Centre

• Nigam Tanya

  Imec

• Heyns M

  Imec Leuven Bel

• GROESENEKEN Guido

  IMEC

• Degraeve Robin

  Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium

• Groeseneken Guido

  Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium

• Nigam Tanya

  Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium

• Heyns Marc

  Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium

• Depas Michel

  Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium

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著作論文

• Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime
• Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime

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