DEPAS Michel | Interuniversity Microelectronics Centre
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概要
関連著者
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DEPAS Michel
Interuniversity Microelectronics Centre
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HEYNS Marc
IMEC
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Degraeve Robin
Imec
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Depas Michel
Imec Vzw
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Heyns Marc
Interuniversity Microelectronics Centre
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Nigam Tanya
Imec
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Heyns M
Imec Leuven Bel
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GROESENEKEN Guido
IMEC
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DEGRAEVE Robin
Interuniversity Microelectronics Centre
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NIGAM Tanya
Interuniversity Microelectronics Centre
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GROESENEKEN Guido
Interuniversity Microelectronics Centre
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Depas Michel
IMEC
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Heyns Marc
Interuniversitary Micro-Electronics Center
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Degraeve Robin
Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium
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Groeseneken Guido
Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium
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Nigam Tanya
Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium
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Heyns Marc
Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium
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Depas Michel
Interuniversity Microelectronics Centre, Kapeldreef 75, B-3001 Leuven, Belgium
著作論文
- Gate Voltage Dependence of Reliability for Ultra-Thin Oxides
- Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime
- Reliability of Ultra-Thin Gate Oxides Below 3nm in the Direct Tunneling Regime
- Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime