Heyns M | Imec Leuven Bel

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概要

• HEYNS Marcの詳細を見る
• 同名の論文著者
• Imec Leuven Belの論文著者

関連著者

• HEYNS Marc

  IMEC

• Heyns Marc

  Interuniversity Microelectronics Centre

• Heyns M

  Imec Leuven Bel

• Degraeve Robin

  Imec

• Depas Michel

  Imec Vzw

• Nigam Tanya

  Imec

• GROESENEKEN Guido

  IMEC

• DEPAS Michel

  Interuniversity Microelectronics Centre

• Depas Michel

  IMEC

• Verhaverbeke S

  Imec Kapeldreef

• Alay Josep-lluis

  Imec Kapeldreef : Lcmm Universitat De Barcelona

• ALAY Josep-Lluis

  IMEC, Kapeldreef

• VERHAVERBEKE Steven

  IMEC, Kapeldreef

• VANDERVORST Wilfried

  IMEC, Kapeldreef

• HEYNS Marc

  IMEC, Kapeldreef

• DEGRAEVE Robin

  Interuniversity Microelectronics Centre

• NIGAM Tanya

  Interuniversity Microelectronics Centre

• GROESENEKEN Guido

  Interuniversity Microelectronics Centre

• Vandervorst W

  Insys Leuven Bel

• Heyns Marc

  Interuniversitary Micro-Electronics Center

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著作論文

• Critical Parameters for Obtaining Low Particle Densities on a Si Surface in an HF-Last Process
• Gate Voltage Dependence of Reliability for Ultra-Thin Oxides
• Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime
• Reliability of Ultra-Thin Gate Oxides Below 3nm in the Direct Tunneling Regime

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