Heyns M | Imec Leuven Bel
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概要
関連著者
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HEYNS Marc
IMEC
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Heyns Marc
Interuniversity Microelectronics Centre
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Heyns M
Imec Leuven Bel
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Degraeve Robin
Imec
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Depas Michel
Imec Vzw
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Nigam Tanya
Imec
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GROESENEKEN Guido
IMEC
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DEPAS Michel
Interuniversity Microelectronics Centre
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Depas Michel
IMEC
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Verhaverbeke S
Imec Kapeldreef
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Alay Josep-lluis
Imec Kapeldreef : Lcmm Universitat De Barcelona
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ALAY Josep-Lluis
IMEC, Kapeldreef
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VERHAVERBEKE Steven
IMEC, Kapeldreef
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VANDERVORST Wilfried
IMEC, Kapeldreef
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HEYNS Marc
IMEC, Kapeldreef
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DEGRAEVE Robin
Interuniversity Microelectronics Centre
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NIGAM Tanya
Interuniversity Microelectronics Centre
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GROESENEKEN Guido
Interuniversity Microelectronics Centre
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Vandervorst W
Insys Leuven Bel
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Heyns Marc
Interuniversitary Micro-Electronics Center
著作論文
- Critical Parameters for Obtaining Low Particle Densities on a Si Surface in an HF-Last Process
- Gate Voltage Dependence of Reliability for Ultra-Thin Oxides
- Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime
- Reliability of Ultra-Thin Gate Oxides Below 3nm in the Direct Tunneling Regime